Attachments

 

Detector

 

Monochromators

 

Sample holders

 

Thin film and texture

 

High temperature cameras

 

Low temperature cameras

 

AC Station

 

Water cooling systems

High-precision, vertical/horizontal goniometer

High speed rate (1000°/min) and high precision angle reproducibility (±0.001°) provide fast measurement and highly reliable data. The goniometer is essentially composed of two precision gear-wheels, supported by high precision ball races. Each wheel is coupled to an anodised aluminium disk, upon which are turned some grooves for easy mounting of accessories.
Easy to handle: compact dimensions permit vertical and horizontal mounting by utilising a suitable optical stand.
The X-ray beam collimation is obtained by a series of fixed but interchangeable bayonet-joint slits that guarantee a perfect alignment of the beam in the horizontal direction, while in the vertical direction the divergence is limited by Soller slits.
The bracket of the incident beam slits, is mounted on the X-ray tube shield; this greatly facilitates the alignment, that is already simplified by the micrometric movements of the horizontal and vertical stand, about X-Y-Z axis. 

 

Features

  • Multi-purpose X-ray diffractometer
  • Ultra stable X-ray generator with an on-board microprocessor controlled via a PC serial port
  • Tube shield with a tube that can be rotated to allow the use of the point or the line focus
  • Focusing Ka1 monochromators for high intensity and resolution
  • Parallel-beam optics using a Max-FluxTM Optical System
  • Possibility of changing automatically from transmission to reflection mode
  • High precision, high speed goniometer
  • Secondary monochromator suitable for Ag, Cr, Fe, Cu, Co and Mo radiations
  • Xenon gas filled proportional, scintillation, linear and curved position-sensitive detectors
  • Non-ambient analysis, low and high temperature attachments
  • Microsoft’s Windows 98/NT/2000/ME operating system in a 32-bit environment for data processing and instrument control
  • Crystallographic software including Rietveld’s refinement
 

The latest multi-functional diffraction system developed by Ital Structures

Data accuracy, simplicity of use and great versatility are the main features of this multi-functional system. 

The APD 2000 digital powder diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows 98/NT/2000/ME operating system. 

The APD 2000 diffractometer can be equipped with various attachments for your special field of research. In addition, custom-designed accessories can be manufactured to your specifications. 

Great attention has been given to operator safety: a series of devices are used to prevent accidental danger from irradiation and an X-ray proof cabin covers the working table. 

The APD 2000 offers solutions for a wide range of analytical requirements, from routine qualitative and quantitative analysis, to residual-stress analysis, thin films, texture, non-ambient analyses, retained austenite quantification, crystallite size/lattice strain and crystallinity calculations. 

Fields of application include: environment, soil/rocks, clay, minerals, ceramics, cement, glass, petroleum, catalysts, polymers, agricultural science, biosciences, chemicals, pharmaceuticals, cosmetics, paints, nuclear, steels, textiles, electronic and magnetic materials.

 

Click Here to see the APD 2000 Standard configuration

 

Click Here to see the APD 2000 Installation requirements

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