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Scintillation NaI counter and xenon gas filled
proportional counter |
Scintillation
NaI and xenon gas filled proportional counters are
our standard detectors |
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Linear
position sensitive proportional counter |
Designed for simultaneous data collection, allows to reduce the recording time by a factor of 100
to 1000. It can measure the intensity distribution of a region of 10° or more with good spatial resolution. This detector is ideally suited for phase transformation studies as a function of temperature and stress analysis.
The counter (Ar/CH4 or Xe/CH4 90:10) operates under a pressure of 7.5 bar. The detector incorporates 2 charge-sensitive preamplifiers.
As option the detector can be run on different gases depending on the customer’s
application. |
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Main
specifications: |
| Window
length |
50
mm |
| Window
height |
10
mm |
| Spatial
resolution |
<
60 mm |
| Efficiency CuKa
(argon-methane) |
50
% |
| Efficiency CuKa
(xenon-methane) |
90
% |
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is possible to optimise efficiency, spatial
resolution and energy resolution by proper choice
of the operating parameters, gas, pressure and
high voltage. |
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Curved
position sensitive counters |
The
CPS 120 and 590 have, as their main
characteristics, the simultaneous detection of
diffracted X-rays over a range of 120 and 90
degrees. The anode construction perform position
analysis by applying high bias voltage and causing
electron avalanche, which gives an excellent
signal to noise ratio. The Curved Position
Sensitive Counters can be used for a
variety of applications: powder, pole figure,
stress, kinetic studies etc. |
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Main
specifications: |
| CPS
120 |
CPS
590 |
| Focusing
radius: 250 mm |
Focusing
radius: 500 mm |
| Window
height: 8 mm |
Window
height: 8 mm |
| Measuring
angle range: 120° (2 theta) |
Measuring
angle range: 90° (2 theta) |
| Angular
resolution: 0.03° (2 theta) |
Angular
resolution: 0.02° (2 theta) |
| Gas:
Argon/Ethane high purity |
Gas:
Argon/Ethane high purity |
| Gas
pressure: 5.5 bars/gas flow |
Gas
pressure: 5.5 bars/gas flow |
| Integral
non-linearity: ± 1% |
Integral
non-linearity: ± 1% |
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| Principle
of the curved detector |
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principle is similar to that of a linear detector.
A blade shaped curved anode with a sharp edge of a
radius of a few
tenths of a micron an intense electric field is
applied. To maximize mechanical stability, the
anode was designed as a very thin curved blade (object
of patent). The X photons ionize the gas in the
detector. The electrons are immediately
accelerated, and additionally have sufficient
energy to ionize other argon atoms. A very fast
multiplication phenomenon appears, so called “avalanche”.
On the cathode readout strips an inducted charge
arrives perpendicular to the impact point of the
avalanche. The position of this charge is
determined by the delay-line method. The charge
travels to the left and to the right along this
delay line to both ends of the line. The
difference in arrival times of the charge at each
end correlates to the avalanche position on the
anode. |
| Advantages
of the curved detector |
In
order to save time and to digitally record data,
it became necessary to create an acquisition
device faster than existing ones, offering easy
computational treatments. Linear detectors were
developed, but because of parallax errors, were
not suitable for accepting a wide angular range of
detection.
To address these issues, the curved position
sensitive detector, also called gaseous blade
chamber, was designed. Because of the curvature,
diffracted X-rays arrive perpendicular to the
detector anode. |
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