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The latest diffraction system manufactured by Ital Structures for material research and development, as partner of the
ESQUI European Project |
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Features |
- Ultra
stable X-ray generator with an on board microprocessor
controlled via a PC serial port
- High
brilliance glass and ceramic X-ray tubes, quickly
rotatable between line and point focus positions
- X-Y
and rotatable stage for the tube shield
- Parallel-beam
optics using a Max-FluxTM
Optical System
- Big
Eulerian cradle open chi-circle to align the sample in
space
- High,
fast precision goniometer positioning by stepping
motors with optical encoders
- Seven
degrees of freedom, all motorised.
- Motorised
sample holder of large dimensions with X-Y-Z
translation, 150 mm in X and Y, 25 mm in Z to
accommodate wafers of 200 mm or other types of sample
- Secondary
monochromator for Cr, Fe, Co, Cu and Mo radiations
- High
mechanical stability of the goniometer supported by a
granite table
- Xenon
gas-filled proportional, scintillation counters, solid
state, linear and curved position-sensitive detectors
for either low background or high intensity
- Microsoft’s
Windows NT/2000/ME operating system in a 32-bit
environment for instrument control, acquisition and
reduction of data
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The
new dimension in X-ray diffraction |
The HRD 3000 high resolution diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows
98/ME operating system. Exact angular positions of the goniometer circles are guaranteed by a well-devised combination of stepping motors and optical encoders. The goniometer circles are positioned at high speed.
The HRD 3000 diffractometer system can be used on a wide range of analytical problems, from texture to thin film analysis, strain measurements and reflectometry.
With this high performance, high resolution diffractometer, you can obtain outstanding results with amazing ease, when determining layer thickness and composition in semiconductors. The high resolution reflectometry studies can be performed with the HRD 3000 to characterise layer thickness, density, surface and interface roughness.
Seven independent degrees of movement freedom, allowing every possible sample position.
The high efficiency of the various components permits analytical results of high quality.
Different kind of source and optical components, several detectors and special attachments can be added to meet all your requirements. You have the choice of a large number easily mounted components. For more information on our system, attachments, and custom design accessories, contact us directly.
Powerful, user-friendly software makes measurement easier than ever and includes many sophisticated features to aid in the interpretation of the
results. |
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