|
X-ray
generator
(PC controlled) |
Maximum
output power |
3
kW |
| Output
stability |
<0.01%
(for 10% power supply fluctuation) |
| Max.
output voltage |
60
kW |
| Max.
output current |
60
mA |
| Voltage
step width |
0.1
kV |
| Current
step width |
0.1
mA |
| PC
control serial mode |
X-ray
ON/OFF, settings of kV and mA, shutters |
| Safety
devices |
Door
interlock mechaninsm, emergency push button X-ray ON lamp |
| Weight |
45
kg |
| Size |
Width
48.3 cm, height 22 cm, depth 63 cm |
|
|
| |
|
X-ray
tube |
Type |
Glass,
Cu anode, fine focus |
| Focus |
0.4
x 8 mm |
| Max.
output |
1.5
kW |
|
|
| |
|
Tube
shield |
Type |
X-Y
and rotatable stage |
|
|
| |
|
Goniometer |
Type:
GD 2000 |
Independent
theta/2 theta horizontal |
| Variable
scanning radius |
175
- 220 mm |
| Vertical
scanning angular range |
-110°
< 2 theta < +165° |
| Smallest
selectable stepsize |
0.0001°
(2 theta) |
| Angular
reproducibility |
±0.0001°
(2 theta) |
| Scanning
speed |
0.05°
- 50°/min |
| Divergence
slits |
4°;
2°; 1°; 1/2°; 1/4° |
| Anti-divergence
slits |
4°;
2°; 1°; 1/2°; 1/4° |
| Receiving
slits |
0.3;
0.2; 0.1 mm |
| Soller
slits |
2°;
5° |
|
|
| |
|
Eulerian
cradle |
Type:
big open Chi-circle |
- 3°
£
Chi £
+ 158°;
-¥ <
Phi < +¥ ;
- 75 mm £
X,Y £
+ 75 mm; - 1 mm £
Z £
+ 24 mm |
| Inner
diameter |
400
mm |
|
|
| |
|
Detector |
Type |
Scintillation
Counter NaI |
| Countrate |
500000
c/s |
| HV/PHA |
High
voltage supply 600 - 2000 V, gain, low, central and high level
control |
|
|
| |
|
Case |
Dimensions |
Width
1190mm, height 1777mm, depth 800mm |
| Leakage
X-rays |
<
1 mSv/Year |
|
|
| |
|
Alignment
kit |
Type |
Adjusted
microscope and tools |
|
|
| |
|
Processing
unit |
Computer
type |
Personal
computer, the latest version |
| Items
controlled |
X-ray
generator, goniometer, detector, counting chain |
| Basic
data processing |
Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation, texture, strain, reflectometry. Pattern simulation, ODF calculated with different methods. |
|
|
| |
|
|