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Secondary curved phyrolitic graphite monochromator
suitable for Ag, Cr, Fe, Cu, Co and Mo radiations |
 This
attachment is installed in the X-ray detection unit. It is
designed to remove continuous X-rays, Kb
rays
as well as fluorescent X-rays emitted from the sample. It
can selectively take out monochomatized X-rays required
for analysis ensuring diffraction patterns with a
excellent signal to noise ratio. |
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Focusing germanium, quartz, silicon
Ka1 monochromators |
 By
means of focusing monochromators is possible to obtain
powder diffractograms with strictly monochromatic peak
profile. The use of focusing X-ray monochromators leads
to a considerable decrease of the background scattering
level as well as to an improvement in resolution. Many
organic and inorganic compounds have complicated
diffraction patterns with overlapping lines. For high
precision crystallographic studies in necessary to have
pure Ka1 radiation for optimum line
separation. |
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Max-FluxTM
Optical System |
 For parallel beam powder diffraction applications,
the Max-FluxTM
Optical System
could be mounted as attachment. It made the parallel beam in one dimension while letting it diverge in the other dimensions. The resulting parallel beam is directed onto samples mounted on the theta stage of the APD 2000 diffractometer.
With the Max-FluxTM
Optical System, exact positioning of the sample is not necessary, and irregularly-shaped, non-flat specimens can be examined without difficult. For this reason you can easily do stress analysis of bulk samples. |
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2/4-Bounce
germanium channel cut monochromators |
The coupling between the
Max-FluxTM
Optical System and the 2/4-bounce Germanium channel cut monochromators offer several solutions for all of your
applications.
We are able to realise several kind of configurations designed to fulfill your individual
requirements.
The main goal of the “coupling” is to create a very intensive and parallel X-ray
beam.
Thanks to the modular design of the HRD 3000
diffractometer, we are always able to change quickly the configuration to meet your new
application.
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Incident
beam |
Diffracted
beam |
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4-bounce
Monocromathor Ge 022
- Symmetrical
Germanium 022 reflection
- Pure
Ka1
radiation
- High
incident beam intensity and small beam
divergence (< 0.0035°)
- High
resolution X-ray diffraction experiments
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2-bounce
Monocromathor Ge 022
- 2-bounce
Germanium channel cut crystal with 022
reflection
- Very
high resolution in the diffracted beam
- Optical
component for reciprocal space investigations
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4-bounce
Monocromathor Ge 044
- Symmetrical
Germanium 044 reflection
- Extremely
pure Ka1
radiation
- Very
small incident beam divergence (<0.0014°)
and moderate beam intensity
- Strong
resolution requirements in high resolution
X.-ray diffraction experiments
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Second
Max-FluxTM Optical System
- Diffracted
beam Max-FluxTM Optical System for
parallel beam
- Very
high reflectivity and high angular resolution
- Well
suited optical component for fast measurement
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