Thin film X-ray diffractometer attachment
The thin film attachment is used in the APD 2000 diffractometer when polycrystalline samples in the form of thin film or multi-layers have to be analysed with the grazing beam geometry. The X-ray beam pass through an horizontal Soller slit system and is made to fall on the rotational sample stage. The diffracted beam optics is modified to a parallel beam optics and a flat monochromator made of graphite is incorporated in the diffracted beam.
The attachment consists of a special detector holder where a narrow vertical soller slit is mounted and also a flat monochromator.
The unfavourable ratio between the signal from the covering layer and the signal from the substrate obtained with the focussing arrangement according to Bragg-Brentano is in this manner greatly improved.
This attachment converts the geometry of the APD 2000 to parallel beam optics. 
An other possibility is to use the Max-FluxTM Optical System instead of the Soller slit systems to reach the condition of the parallel beam.
Monochromator Graphite (002) or LiF(100) flat crystals
Sample size 40 mm dia. maximum
Diffracted Soller slit 0.15 or 0.4 degrees
 

Eulerian Cradle for texture analysis
The Eulerian Cradle is a symmetric device with full rotation range of 360 degrees for both circles. The segment shaped phi-circle box within the chi-circle prevent drastically against shadowing. So, this model is optimally suited for texture analysis.
As standard, an oscillation device with flat specimen holder is included allowing for reflection and transmission geometry, as well. The amplitude is adjustable from 0 to 12 mm, the frequency is fixed by the synchronous motor drive. Both circle are equipped with stepper motors and 0-point controls. The standard sample size may be 20 x 15 x 5 mm.
Several collimator types may be inserted into the primary beam.
 
Eulerian Cradle Segment shaped phi-circle Collimators

 

Click here to see the Eulerian Cradle Technical Data
 

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