|
X-ray
generator
(PC controlled) |
Maximum
output power |
3
kW |
| Output
stability |
<0.01%
(for 10% power supply fluctuation) |
| Max.
output voltage |
60
kW |
| Max.
output current |
60
mA |
| Voltage
step width |
0.1
kV |
| Current
step width |
0.1
mA |
| PC
control serial mode |
X-ray
ON/OFF, settings of kV and mA, shutters |
| Safety
devices |
Door
interlock mechanism, emergency push button X-ray ON lamp |
| Weight |
45
kg |
| Size |
Width
48.3 cm, height 22 cm, depth 63 cm |
|
|
| |
|
X-ray
tube |
Type |
Glass, Mo/W anode, long fine focus |
| Focus |
0.4
x 12 mm |
| Max.
output |
2.2
kW |
|
|
| |
|
Multilayer monochromator |
Type |
Si/W |
| Reflectivity |
(80%
W(La) and 70% Mo
(Ka)) |
|
|
| |
|
Automatic sample changer |
Sample seating |
12 for TXRF - 1 for EDXRF (45°) |
|
|
| |
|
Detector |
Type |
Si-Li |
| Active area |
20
mm2 - (10 mm2, 30 mm2 and 80
mm2 as options) |
| Thikness |
3.5
mm |
| Energy resolution |
< 137 eV (Mn
ka, 1000
cps) |
| Pulse capacity |
> 10.000 cps |
| Entry window |
8
mm Be + 1
mm DuraBe for detection of elements from sodium upward |
|
|
| |
|
UHV Dewar |
Type |
Stainless steel with
LN2 level control unit |
| Cryostat volume |
3.8 l |
| Evaporation rate |
0.6 l/day |
| Dimensions (diam x h) |
200 x 400 mm |
| Weight (without
LN2) |
5 Kg |
|
|
| |
|
Preamplifier |
Type |
Pulsed reset |
|
|
| |
|
Spectroscopic ampifier |
Type |
Active filtering (Gaussian shape) |
| Selectable time constants |
4 |
| Switchable amplification ranges |
4 |
| Zero peak generator, actine base line restorer, pulse pile-up rejector, all settings PC-controlled |
|
|
| |
|
ADC |
Type |
Successive approximation |
| Channels maximum |
4096 |
| Conversion time |
10
ms |
|
|
| |
|
Processing
unit |
Computer
type |
Personal
computer, the latest version |
| Items
controlled |
X-ray generator, tube shield, monochromator, detector, counting chain |
| Operating
System |
Windows
98/ME |
| Basic
data processing |
X-ray generator load settings; Multisample positioning; Counter chain parameter settings; Selection of radiation; Centring procedure; K, L, & M markers; Time or count selection; Acquisition of data in both geometries; Least square Marquardt fit procedure for the area calculation (spectral analysis); Automatic/manual search function; Manual or automatic calibration of energy; Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection; For the 45 degrees geometry the following methods are available: Emission/Transmission (for powder/light matrix samples); Fundamental parameters using relationship between incoherent and coherent radiations for evaluation of the dark matrix, Fundamental parameters (for alloys), Thin film, Semi-empirical corrections for matrix effect, A set of tools for calculating: fundamental parameters, fluorescence yield, edge jump, detector efficiency, differential cross section (coherent and incoherent), atomic form factor, incoherent scattering function, elements lines and ratios,
stoichiometry. |
|
|
| |
 |