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The
system, based on the Curved
Position Sensitive Detector, has, as its main
characteristic, the simultaneous detection of diffracted
X-rays over a range of 120 or 90 degrees using the CPS
120 or the CPS 590
detectors respectively.
The
monochromator housing, connected to the tube shield,
holds a curved crystal (Johansson type) with an
asymmetrical focussing geometry. An easy-to-use
alignment tool permits a selection of X-ray beams with
exclusively Ka1 radiation.
The
X-ray generator is ultra stable with an on-board
microprocessor controlled via a PC serial port.
The
tube shield itself, is provided with a radial
micrometric adjustment and the X-ray beam is collimated
using a cross slit.
Several
kind of source and optical components, sample holders,
curved detectors, low and high temperature attachments can be added to meet all
your requirements. In addition, custom-designed
accessories can be manufactured to your specifications.
For
parallel beam powder diffraction applications, a single
parabolic mirror can be mounted as an attachment.
With the Max-FluxTM
Optical System, exact positioning of the sample
is not necessary, and irregularly-shaped, non-flat
specimens can be examined without difficulty.
The
X-RED diffractometer system permits one to work in both
transmission and reflection modes.
The
apparatus uses Microsoft’s Windows 98/ME
operating system in a 32-bit environment for real time
data processing and instrument control, including the
temperature attachments.
Powerful
and user-friendly crystallographic software including
Rietveld’s refinement makes measurement easier than
ever and includes many sophisticated features to aid in
the interpretation of the results.
Great
attention has been given to operator safety: a series of
devices are used to prevent accidental danger from
irradiation and an X-ray proof cabin covers the working
table. |
